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Fully automatic wafer probe station
Suitable for 4-12 inch wafer testing, it can provide different testing environment configurations such as high and low temperature, high voltage, and low leakage The device is simple to use, with
CP300 semi-automatic alignment probe station
Automatic alignment test on wafer, simple and fast operation, high resolution and MAP display function.
CRX-SM Low temperature superconducting vacuum probe station
Temperature range 8K-300K; IV/CV/Microwave/Optoelectronic Experimental Testing/Superconducting Vertical Magnetic Field Measurement/Low Temperature Testing
CRX-Closed cycle low-temperature probe station
Temperature range 4.5K-350K; IV/CV/Microwave/Optoelectronic Experimental Testing/Superconducting Vertical Magnetic Field Measurement/Low Temperature Testing
CM-4 mini probe station
Mini size, modular design, for I-V/C-V, PIV test, optoelectronic test, up to 6 inch wafer, applicable to glove box
CS-4 small probe station
Small size, modular design, light weight, up to 6 inch wafer, for I-V/C-V, PIV, optoelectronic tests, applicable to glove box
CL-6 middle-sized probe station
Modular design, precise screw drive structure, up to 8 inch wafer, upgradable for RF test, high current test and laser repair applications.
CH-8-D
CINDBEST CH-8-D 雙面點(diǎn)針探針臺(tái)可用于晶圓和PCB板測(cè)試，用于需要正面和背面同時(shí)扎針，以實(shí)現(xiàn)各種光/電性能測(cè)試需求的測(cè)試設(shè)備。該定制探針臺(tái)具有優(yōu)良的機(jī)械系統(tǒng)，穩(wěn)定的結(jié)構(gòu)，符合人體工程學(xué)，以及多項(xiàng)升級(jí)功能�？蓮V泛應(yīng)用于集成電路、Wafer ， LED、LCD、太陽能電池等行業(yè)的制造和研究領(lǐng)域。
CH-8 large-sized comprehensive probe station
Modular design, seamless upgrade, up to 12 inch wafer. Quick and fine-tuning lift function for chuck stage. Capable for Wafer test, PCB/IC test, RF test, high voltage and current tes
CH-12 large-sized comprehensive probe station
Modular design, seamless upgrade, up to 12 inch wafer, high precise screw drive structure, linear movement, quick and fine-tuning lift function for chuck stage, capable for Wafer test, PCB/IC test,
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