CL-4 | 4~8" middle-sized for basic I-V/C-V test
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Features/ Aplications
◆ For I-V/C-V, PIV, optoelectronic test
◆ Up to 8 inch wafer
◆ Precise screw drive structure, linear movement
◆ Compatible with high magnification metalloscope, fine-tuning movement
◆ Capable to be upgraded for RF test, high current test and laser repair applications
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Specifications
Chuck Stage
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Model |
CL-4/CL-6/CL-8 |
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Chuck size |
4"/ 6" /8" |
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Rotation range |
360° with angle locking, fine-tuning for 15° with 0.1° resolution |
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X-Y travel range |
4"*4"/6"*6"/8"*8" |
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X-Y travel resolution |
10μm/2μm/0.7μm/0.5μm |
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Z travel range |
10mm |
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Sample mounting type |
Vacuum |
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Chuck capacity |
Up to 6 micropositioners |
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Electrical design |
Electrical floating on chuck back, can be used as gate electrode |
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Dimension |
400mmL*400mmW*600mmH/580mmL*480mmW*600mmH |
Optical sytem
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Microscope |
Single tube microscope /stereo microscope / metalloscope |
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Magnification |
16X-200X/20X-4000X |
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Travel range |
X-Y up to 2"*2", vertical to 50.8mm |
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Camera |
CCD Camera |
Micropositioner
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X-Y-Z travel range |
12mm-12mm-12mm |
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Mounting mode |
Magnetic/vacuum |
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Resolution |
10μm/2μm/0.7μm/0.5μm upon request |
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Leakage current |
10pA / 100fA |
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Cable adaptor |
BNC/Banana head/Crocodile clip/Coaxial/Triaxial upon request |
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Probe tip diameter |
0.2μm/1μm/2μm/5μm/10μm/20μm upon request |
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Probe metal |
Tungsten/Beryllium copper upon request |
Optional accessories
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Hot chuck |
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Shielding box |
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Display screen |
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Gold plated Chuck |
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Special adapter |
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Vibration free table |
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RF test accessoriess |
Notice:
Probe stations can be customized to customer requirements.
Specifications and designs are subject to change without notice.
All Rights Reserved. Shenzhen Cindbest Technology Co., Ltd
Shenzhen Cindbest Technology Co., Ltd
Add: 8F Weihuada Industrial Park No.5 Lirong Rd Xinshi Com Dalang St Longhua Dist Shenzhen,China
Tel: 0755-29412885
E-mail: aldrich@cindbest.com; francowang@cindbest.com
