国产精品手机免费,欧美成人秋霞久久AA片,人妻春色第7页

Anatomy of a Probe Station System

2018-10-055159

Anatomy of a Probe Station System

The probe station system is divided into a manual probe station and an automatic probe station. Below we mainly analyze the manual probe station:

Probe station use:
The manual probe station is also known as the probe test station. The main purpose is to provide a test platform for the electrical parameter test of semiconductor chips. The instrument can complete the voltage, current, resistance, and capacitor voltage characteristic curves of the integrated circuit. It is suitable for scientific research analysis, spot check and other purposes of chip.

Composition of the probe station system:

Probe table base + microscope + probe holder + probe holder + probe + test source table Test source table to complete)

Probe station test environment:

Available test environments are: normal temperature, high temperature, high and low temperature test, vacuum high and low temperature, high pressure, radiation and magnetic field environment.

The tests that can rely on the probe station are:

Serial number

Classification according to test samples

Serial number	Classification according to test samples	Serial numbe	Serial number Classified by application
1	Wafer test	1	RF test
2	LED test	2	High temperature environment test
3	Power device testing	3	Low current (100fA level) test
4	MEMS testing	4	I-v / c-v / p-iv test
5	PCB test	5	High voltage, high current test
6	LCD panel test	6	Magnetic field environmental test
7	Solar cell test	7	Radiation environment test
8	Material surface resistivity test	9	Integrating sphere test

Previous：Optical 3D surface profiler

Next：How the manual probe station works

Recommend

2016-05-13
GGB RF Probe Selection Method
2024-04-07
Principle and Application Fields of Magnetic Field Probe Station
2024-04-03
Classification and Corresponding Parameter Explanation of High-Low Temperature Probe Stations
2024-04-01
Characteristics and Applications of Waveguide Probes
2024-03-27
Classification and Application Scenarios of High-end Probe Stations
2024-03-26
What is a DC probe and its application fields?
2024-03-25
Probe Station Selection Guide: How to choose the most suitable probe station for your laboratory?
2024-03-16
Analysis of High-Temperature Test and Measurement Probe Station System
2024-03-11
Probe station: unlocking the infinite possibilities of semiconductor testing
2024-03-04
Take you to understand the mid-end probe station and its corresponding technical parameters

中文字幕精_色婷婷五月综合欧美图片_樱花草日本在线WWW官网_男人狂桶女人出白浆免费视频_美国十次狠狠色综合AV_啦啦啦www日本高清免费观看