Low temperature ceramic probe
• Standard ceramic probe • Probe tip angle 120 ° • Used for high and low temperature testing
EasyZoom Super Depth Digital Microscope
Thanks to its independently developed advanced optical system, the Motic EasyZoom series ultra depth digital microscope can easily capture high-quality images Quantitative image. Powerful multifunct
Fully automatic wafer probe station
Suitable for 4-12 inch wafer testing, it can provide different testing environment configurations such as high and low temperature, high voltage, and low leakage The device is simple to use, with
CP300 semi-automatic alignment probe station
Automatic alignment test on wafer, simple and fast operation, high resolution and MAP display function.
CRX-SM Low temperature superconducting vacuum probe station
Temperature range 8K-300K; IV/CV/Microwave/Optoelectronic Experimental Testing/Superconducting Vertical Magnetic Field Measurement/Low Temperature Testing
CRX-Closed cycle low-temperature probe station
Temperature range 4.5K-350K; IV/CV/Microwave/Optoelectronic Experimental Testing/Superconducting Vertical Magnetic Field Measurement/Low Temperature Testing
CM-4 mini probe station
Mini size, modular design, for I-V/C-V, PIV test, optoelectronic test, up to 6 inch wafer, applicable to glove box
CS-4 small probe station
Small size, modular design, light weight, up to 6 inch wafer, for I-V/C-V, PIV, optoelectronic tests, applicable to glove box
CL-6 middle-sized probe station
Modular design, precise screw drive structure, up to 8 inch wafer, upgradable for RF test, high current test and laser repair applications.
CH-8-D
CINDBEST CH-8-D 雙面點針探針臺可用于晶圓和PCB板測試，用于需要正面和背面同時扎針，以實現各種光/電性能測試需求的測試設備。該定制探針臺具有優良的機械系統，穩定的結構，符合人體工程學，以及多項升級功能。可廣泛應用于集成電路、Wafer ， LED、LCD、太陽能電池等行業的制造和研究領域。
