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Low temperature ceramic probe
• Standard ceramic probe • Probe tip angle 120 ° • Used for high and low temperature testing
ST series hard probe
Cindbest Acts for the US GGB Full Probe Series ST series hard probe used in DC test The whole series are: ST-20-0.5, ST-20-1, ST-20-2, ST-20-5, ST-20-10, ST-20-25, ST-20-50, ST-20- 100
T-4 series soft probe
T-4 series soft needles are mostly used for spot-testing integrated circuits, electrodes, or mini electrodes made of FIB (Focused Ion Beam). The whole series are: T-4-5, T-4-10, T-4-22, T-4-3
Kelvin / pulse probe
specification: Resolution: less than 10fA Probe pitch: from 12 to 100 μm can be customized according to requirements Very low parasitic capacitance
Electron microscope probe
PT-14-6705-B electron microscope probe
